Showing results: 46 - 60 of 72 items found.
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Hprobe Company
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
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R.S.T. Family -
Ultra-X INC.
Memory is one of the most notoriously difficult core system functions to troubleshoot, exercise, and validate. PC's are not only being equipped with increasingly large amounts of RAM but their often complex system hardware and software configurations can make it even more difficult to determine if a problem is truly a RAM failure. Such problems vary with different combinations of chipsets, processors or motherboards. R.S.T. 4 Premium''''s capabilities far exceed those of stand-alone testers in meeting all of these challenges.
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T5503HS2 -
Advantest Corp.
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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ATC Series -
AIMCO
The Auditor Torque Cube (ATC) is a compact, versatile desktop tester and provides a multitude of capabilities. The ATC is designed to test hand or power tools with the following: Peak, first peak and track modes. Multiple engineering units. Manual and auto clear function. Multiple frequency response settings. Bi-directional use and accuracy. Accuracy is better than 1% of indicated reading top 90% of range. Serial data output. Memory 999 data samples. Battery and/or mains powered.
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Extech CG304-REF -
Extech Instruments Corporation
The Extech CG304 Coating Thickness Tester offers a non-destructive way of measuring the thickness of ferrous and non-ferrous substrates with automatic recognition of the material being measured. Memory stores 2500 readings. The unique Bluetooth® interface feature wirelessly transmits data to your PC for further analysis, and it enables you to generate a documented report. Includes a special LCD with backlight feature and contrast for easy viewing in various lighting conditions. Complete with two AAA batteries, software, hard case, steel and aluminum substrates, and standard films for calibration.
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Extech CG304 -
Extech Instruments Corporation
The Extech CG304 Coating Thickness Tester offers a non-destructive way of measuring the thickness of ferrous and non-ferrous substrates with automatic recognition of the material being measured. Memory stores 2500 readings. The unique Bluetooth interface feature wirelessly transmits data to your PC for further analysis and enables you to generate a documented report. Special LCD with backlight feature and contrast for easy viewing in various lighting conditions. Complete with two AAA batteries, software, hard case, steel and aluminum substrates, and standard films for calibration.
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Extech CG204 -
Extech Instruments Corporation
The Extech CG204 is a portable meter designed for non-invasive coating thickness measurements with automatic recognition of ferrous and non-ferrous substrates. The tester uses dual technology to indicate ferrous (magnetic induction measurement) and non-ferrous (eddy current measurement) substrates. It features single and continuous measurement modes as well as direct and group working modes, 400-reading memory storage, and user-programmable high/low alarms. The CG204 comes with two AAA batteries, USB cable, software, calibration iron, calibration aluminum, precision standards, pouch case, and user manual.
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JT 2127/Flex Socket Test Module -
JTAG Technologies Inc.
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Extech CG104 -
Extech Instruments Corporation
The CG104 is a pocket-sized coating thickness tester which offers quick one-handed operation and non-destructive measurements of the thickness of ferrous and non-ferrous substrates. Its unique reversible display allows you to take readings in challenging angles of area being measured, plus it has an easy-to use menu system and backlit display feature. Built-in memory stores/recalls up to 255 readings. Complete with two AAA batteries, calibration standards (one ferrous plate, one non-ferrous plate and one standard coating plate film), wrist strap and soft case.
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NplusT -
Saniffer
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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PHT-1840 -
Phase II Plus
This dedicated unit is designed to test gear teeth and other difficult to access applications. The 1840 is loaded with the same features found on the base 1800 version which includes memory, USB output and software for downloading to your PC. The 1840 hardness tester is capable of measuring the surface hardness of a broad variety of metals on flat and round surfaces. This instrument comes complete with a dedicated DL impact device, calibrated test block and rugged carry case.
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TM263N -
T&M Tools Limited Co
◇ Added Network Cable Test ◇ Accurately test whether a single network cable transmits signals normally ◇ Self Calibration ◇ Set the Auto Off ◇ Wavelength Memory function after turn off the tester ◇ High Accuracy, high ,High sensitivity, high linearity ◇ Stable VFL Output ◇ USB Charge port ◇ FC,SC Connector ◇ 18650Li-ion Battery ◇ Lower power consumption design, long standby time ◇ Rubber Out shell, increased the protective properties for field work
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T5230 -
Advantest Corp.
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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AMIC-30 -
Amperis sl
The AMIC-30 insulation tester is a small portable meter designed to measure insulation resistance in electrical and telecommunications installations, cables, motors, transformers and other equipment. The test voltage can be programmed in steps from 10 V to 1000 V. The instrument can measure both insulation resistance over a wide range (0,1kΩ...100GΩ), and insulation leakage current, capacitance and other parameters. All test results can be stored in the internal memory and sent to a computer via the included wireless USB receiver. The meters are supplied with rechargeable Ni-Cd batteries.
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
